Electrostatic force spectroscopy of near surface localized states

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Electrostatic force spectroscopy of near surface localized states

Abstract Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a semiconductor. Measurement of the frequency shift of the cantilever as a function of tip-sample shows discrete peaks at certain voltages when the tip is located ...

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ژورنال

عنوان ژورنال: Nanotechnology

سال: 2005

ISSN: 0957-4484,1361-6528

DOI: 10.1088/0957-4484/16/3/023